XPS: X-ray Photoeletcron Spectroscopy, Auger Electron Spectroscopy

Fields of application: detecting surface contaminations; investigation of corrosion processes, investigation of diffusion processes and interfacial phenomena; analysis of thin layers; work function measurements; research topics in the fields of nanotechnology and semiconductor technology;

Energy analyser: Specs Phoibos 150, X-ray source: Thermo XR4, Electron gun: VG Microtech LEG200

Contact: Dr. Olga Krafcsik: krafcsik@eik.bme.hu, Gábor Dobos: dobosg@eik.bme.hu


Kutatási terület: