Application of scanning probe microscopy

The aim of the research is capturing high-resolution atomic force microscopy images from nanostructures, from materials science samples or even from biological samples using a Bruker Dimension Icon set. The tool diameter is 210 mm and is equipped with a general purpose vacuum probe holder, ensuring the possibility of a large surface area measurements. Our research can be carried out in air and fluid medium. In addition to the topological imaging of materials, we also researching the nano-electrical and nano-mechanical properties of the material.

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Fizikai optika