Csíkvári, Péter

Research associate

Member
Office: 
F III. GF.
Email: 
raman (at) freemail.hu
Telephone: 
+36 1 463 1589

Most important Publications

T. Lohner, P. Csíkvári, P. Petrik, G. Hárs
Spectroellipsometric characterization of nanocrystalline diamond layers, Applied Surface Science, No.:281, p.113-117, 2013
 
T. Lohner, P. Csíkvári, P. Petrik, G. Hárs
Spectroellipsometric characterization of nanocrystalline diamond layers, E-MRS Fall Meeting 2012, Symposium K, Warsaw, Poland, Sept. 17-21, 2012
 
T. Lohner, N. Q. Khánh, M. Serényi, P. Csíkvári, G. Hárs, A. Pongrácz, P. Petrik
Spectroellipsometric and ion beam analytical investigation of thin films deposited by various methods, JVC-14 / EVC-12 / AMDVG-11 / CroSloVM-19 Confernce, Dubrovnik, Croatia, 4-8 June, 2012
 
T. Lohner, P. Csíkvári, N.Q. Khánh, S. Dávid, Z.E. Horváth, P. Petrik, G. Hárs
Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers, Thin Solid Films, No.:519, p.2806-2810, 2011
 
T. Lohner, P. Csíkvári, N.Q. Khánh, S. Dávid, P. Petrik, G. Hárs:
Spectroellipsometric and ion beam analytical investigation of ultrananocrystalline diamond layers, 5th International Conference on Spectroscopic Ellipsometry, Albany, NY USA, 23-28 May, 2010
 
M. Koós, S. Tóth, P. Csíkvári, G.Y. Hárs, M. Veres
Luminescence features of nanocrystalline diamond films, 21st European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, and Nitrides, Budapest, Hungary, 5-9 September, 2010
 
P. Csikvari, A. Somogyi, M. Veres, Gy. Hárs, A. Tóth:
Investigation of the combined effect of argon addition and substrate bias on the growth of ultrananocrystalline diamond layers, Diamond & Related Materials, No.:18, p.1459–1465, 2009
 
P. Csikvari, P. Fürjes, Cs. Dücső, I. Barsony:
Micro-hotplates for thermal characterisation of structural materials of MEMS, Microelectronics Journal, No.:40, p.1393– 1397, 2009